Integration of Physical Reliability Knowledge into the Design of VLSI-Circuits

Geest van, D.C.L. and Hoeksma, R.H. and Brombacher, A.C. and Herrmann, O.E. (1993) Integration of Physical Reliability Knowledge into the Design of VLSI-Circuits. In: 31st Annual International Reliability Physics Symposium, 23-25 March 1993, Atlanta, Georgia, USA.

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Abstract:	A systematic approach for modeling failure mechanisms on the circuit level and for using these models for optimization of both reliability and functionability is presented. Since optimization is done using a CAD system, it is possible to carry out such an optimization in a very early stage of the design process. The stress factors of the failure mechanisms are calculated using a circuit simulator and the effect of internal and external tolerances is incorporated in the simulation. From these results the sensitivity of failure behavior for so-called designable parameters on circuit level is determined. This information is used to optimize the design toward minimum occurrence of failures. For functional demands the same methodology is used
Item Type:	Conference or Workshop Item
Copyright:	©1993 IEEE
Research Group:	Signals and Systems (SAS)
Link to this item:	http://purl.utwente.nl/publications/16221
Official URL:	http://dx.doi.org/10.1109/RELPHY.1993.283297
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Metis ID: 113106