Practical Implementation of Defect-Oriented Testing for a Mixed-Signal Class-D Amplifier

Beurze, R.H. and Xing, Y. and Kleef van, R. and Tangelder, R.J.W.T. and Engin, N. (1999) Practical Implementation of Defect-Oriented Testing for a Mixed-Signal Class-D Amplifier. In: IEEE European Test Workshop, 1999, 25-28 May 1999 , Constance, Germany.

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Abstract:	This paper describes the flow of defect-oriented testing from beginning to end, based on the industrial test development for a commercial mixed-signal class-D amplifier. A software tool called DOTSS (Defect-Oriented Test Simulation System) was used to perform the fault simulations. The greatest benefit of using defect-oriented testing turns out to be that it gives more insight in the underlying fault mechanisms. This information can be used to generate complementary tests or to take design-for-testability measures to achieve a high fault coverage
Item Type:	Conference or Workshop Item
Copyright:	©1999 IEEE
Faculty:	Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:	Computer Architecture for Embedded Systems (CAES)
Link to this item:	http://purl.utwente.nl/publications/16157
Official URL:	http://dx.doi.org/10.1109/ETW.1999.804205
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