Bridging the Testing Speed Gap: Design for Delay Testability


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Speek, H. and Kerkhoff, H.G. and Sachdev, M. and Shashaani, M. (2000) Bridging the Testing Speed Gap: Design for Delay Testability. In: IEEE European Test Workshop, 2000, 23-26 May 2000, Cascais, Portugal.

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Abstract:The economic testing of high-speed digital ICs is becoming increasingly problematic. Even advanced, expensive testers are not always capable of testing these ICs because of their high-speed limitations. This paper focuses on a design for delay testability technique such that high-speed ICs can be tested using inexpensive, low-speed ATE. Also extensions for possible full BIST of delay faults are addressed
Item Type:Conference or Workshop Item
Copyright:©2000 IEEE
Faculty:
Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:
Link to this item:http://purl.utwente.nl/publications/16137
Official URL:http://dx.doi.org/10.1109/ETW.2000.873771
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