Computer-Aided Test Flow in Core-Based Design

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Zivkovic, V.A. and Tangelder, R.J.W.T. and Kerkhoff, H.G. (2000) Computer-Aided Test Flow in Core-Based Design. In: 22nd International Conference on Microelectronics, 2000, 14-17 May 2000 , Nis, Yugoslavia (pp. pp. 715-718).

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Abstract:This paper copes with the test-pattern generation and fault coverage determination in the core based design. The basic core-test strategy that one has to apply in the core-based design is stated in this work. A Computer-Aided Test (CAT) flow is proposed resulting in accurate fault coverage of embedded cores. The CAT now is applied to a few cores within the Philips Core Test Pilot IC project
Item Type:Conference or Workshop Item
Copyright:©2000 IEEE
Faculty:
Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:
Link to this item:http://purl.utwente.nl/publications/16130
Official URL:http://dx.doi.org/10.1109/ICMEL.2000.838790
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Metis ID: 113015