Jitter and Decision-level Noise Separation in A/D Converters


Share/Save/Bookmark

Tangelder, R.J.W.T. and Vries, H. de and Rosing, R. and Kerkhoff, H.G. and Sachdev, M. (1999) Jitter and Decision-level Noise Separation in A/D Converters. In: 16th IEEE Instrumentation and Measurement Technology Conference, IMTC 1999, 24-26 May 1999, Venice, Italy (pp. pp. 1558-1562).

open access
[img]
Preview
PDF
443kB
Abstract:Gaussian aperture jitter leads to a reduced SNR of A/D converters. Also other noise sources, faults and nonlinearities affect the digital output signal. A measurement setup for a new off-chip diagnosis method, which systematically separates the jitter-induced errors from the errors caused by these other factors, is described. Deterministic errors are removed via a subtracting technique. High-level ADC simulations and measurements have been carried out to determine relations between the size of the jitter or decision-level noise and the remaining random errors. By carrying out two tests at two different input frequencies and using the simulation results, errors induced by decision-level noise can be removed
Item Type:Conference or Workshop Item
Copyright:©1999 IEEE
Faculty:
Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:
Link to this item:http://purl.utwente.nl/publications/16115
Official URL:http://dx.doi.org/10.1109/IMTC.1999.776087
Export this item as:BibTeX
EndNote
HTML Citation
Reference Manager

 

Repository Staff Only: item control page

Metis ID: 113000