5.5V Tolerant I/O in a 2.5V 0.25um CMOS Technology

Annema, Anne-Johan and Geelen, Govert and Jong de, Peter (2000) 5.5V Tolerant I/O in a 2.5V 0.25um CMOS Technology. In: IEEE Custom Integrated Circuit Conference, CICC 2000, May 21-24, 2000, Orlando, FL, USA.

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Abstract:	Robust high-voltage tolerant U0 that do not need process options is presented, demonstrated on 5.5V tolerant opendrain U0 in a 2.5V 0 . 2 5 C~M OS technology. Circuit techniques limit oxide stress and hot-carrier degradation, resulting in hundreds of years extrapolated lifetime for 5.5V pad voltage swing, 2.2V supply voltage, lOMHz switching frequency. The shown concepts are also implemented in other types of U0 and can easily be scaled towards newer processes.
Item Type:	Conference or Workshop Item
Copyright:	© 2000 IEEE
Faculty:	Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:	Integrated Circuit Design (ICD)
Link to this item:	http://purl.utwente.nl/publications/16094
Official URL:	http://dx.doi.org/10.1109/CICC.2000.852698
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