MISMATCH: A basis for semi-automatic functional mixed-signal test-pattern generation

Kerkhoff, Hans and Tangelder, Ronald and Speek, Han and Engin, Nur (1996) MISMATCH: A basis for semi-automatic functional mixed-signal test-pattern generation. In: Third IEEE International Electronics, Circuits, and Systems, ICECS '96, 13-16 Oct. 1996, Rodos, Greece .

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Abstract:	This paper describes a tool which assists the designer in the rapid generation of functional tests for mixed-signal circuits down to the actual test-signals for the tester. The tool is based on manipulating design data, making use of macro-based test libraries and tester resources provided by the test engineer, and computer-based interaction with the designer
Item Type:	Conference or Workshop Item
Copyright:	©1996 IEEE
Faculty:	Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:	Computer Architecture for Embedded Systems (CAES)
Link to this item:	http://purl.utwente.nl/publications/16071
Official URL:	http://dx.doi.org/10.1109/ICECS.1996.584606
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