Compact Structural Test Generation for Analog Macros

Kaal, Victor and Kerkhoff, Hans (1997) Compact Structural Test Generation for Analog Macros. In: European Design and Test Conference, ED&TC 1997, 17-20 March 1997, Paris, France.

Preview

PDF
778Kb

Abstract:	A structural, fault-model based methodology for the generation of compact high-quality test sets for analog macros is presented. Results are shown for an IV-converter macro design. Parameters of so-called test configurations are optimized for detection of faults in a fault-list and an optimal selection algorithm results in determining the best test set. The distribution of the results along the parameter-axes of the test configurations is investigated to identify a collapsed high-quality test set
Item Type:	Conference or Workshop Item
Copyright:	©1997 IEEE
Faculty:	Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:	Computer Architecture for Embedded Systems (CAES)
Link to this item:	http://purl.utwente.nl/publications/16055
Official URL:	http://dx.doi.org/10.1109/EDTC.1997.582420
Export this item as:	BibTeX EndNote HTML Citation Reference Manager

Show download statistics for this publication

Repository Staff Only: item control page

Metis ID: 112939