Compact Structural Test Generation for Analog Macros


Kaal, Victor and Kerkhoff, Hans (1997) Compact Structural Test Generation for Analog Macros. In: European Design and Test Conference, ED&TC 1997, 17-20 March 1997, Paris, France (pp. pp. 581-589).

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Abstract:A structural, fault-model based methodology for the generation of compact high-quality test sets for analog macros is presented. Results are shown for an IV-converter macro design. Parameters of so-called test configurations are optimized for detection of faults in a fault-list and an optimal selection algorithm results in determining the best test set. The distribution of the results along the parameter-axes of the test configurations is investigated to identify a collapsed high-quality test set
Item Type:Conference or Workshop Item
Copyright:©1997 IEEE
Electrical Engineering, Mathematics and Computer Science (EEMCS)
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