Anomalous Hc in CoCr-films: surface and bulk measurements

Share/Save/Bookmark

Geerts, W.J.M.A. and Lintelo te, J.G.Th. and Lodder, J.C. and Popma, Th.J.A. (1990) Anomalous Hc in CoCr-films: surface and bulk measurements. IEEE Transactions on Magnetics, 26 (1). pp. 36-38. ISSN 0018-9464

[img]
Preview
PDF
284Kb
Abstract:The major and minor loops of RF sputtered CoCr films in the thickness range of 20-1000 nm and the concentration range of 19-24 at.% Cr were measured by Kerr tracer and VSM. Differences between bulk and surface magnetic data are most likely due to a thickness-dependent surface chemical composition. The maximum anomality of the minor loop coercivity, which depends strongly on the film thickness, appears to be larger at the surface than in the bulk. The anomalous coercivity of the minor loop, which is related to a domain pattern change, could be caused by repulsive forces between domain walls. It can be concluded that study of the minor loop coercivities is an interesting research tool for micromagnetic behavior
Item Type:Article
Copyright:©1990 IEEE
Faculty:
Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:
Link to this item:http://purl.utwente.nl/publications/15516
Official URL:http://dx.doi.org/10.1109/20.50482
Export this item as:BibTeX
EndNote
HTML Citation
Reference Manager

 

Repository Staff Only: item control page

Metis ID: 112395