Polarized neutron reflectometry on Co-Cr

Graaf van der, A. and Frederikze, H. and Haan de, P. and Rekveldt, M.Th. and Lodder, J.C. (1995) Polarized neutron reflectometry on Co-Cr. Journal of Magnetism and Magnetic Materials, 140-14 (1). pp. 695-696. ISSN 0304-8853

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Abstract:	Polarized neutron reflectivity of a Co---Cr film on silicon with the easy axis of magnetization perpendicular to the plane has been measured at in-plane magnetic fields of various magnitudes. The obtained data can be well described assuming a constant atomic density and a gradual increase of the in-plane magnetization with depth at the different magnetic fields.
Item Type:	Article
Copyright:	© 1995 Elsevier Science
Faculty:	Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:	Transducers Science and Technology (TST)
Link to this item:	http://purl.utwente.nl/publications/15504
Official URL:	http://dx.doi.org/10.1016/0304-8853(94)00812-4
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Metis ID: 112383