Investigating recording patterns using magnetic force microscopy

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Groenland, J.P.J. (Hans) and Engelen, G.J.P. (Peter) van and Bernards, Jan P.C. and Cramer, Hugo A.J. (1993) Investigating recording patterns using magnetic force microscopy. Journal of Magnetism and Magnetic Materials, 120 (1-3). pp. 327-329. ISSN 0304-8853

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Abstract:The magnetic force microscope is a valuable tool for the qualitative analysis of local phenomena in magnetic recording media. To study the possibilities for a more quantitative analysis, the MFM results have been compared with recording results. It is shown that such analysis is hampered by the nonlinear transfer characteristic and by the masking of local high-definition details due to the application of an auxiliary electrostatic field in the current instrument.
Item Type:Article
Copyright:© 1993 Elsevier Science
Faculty:
Electrical Engineering, Mathematics and Computer Science (EEMCS)
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Link to this item:http://purl.utwente.nl/publications/15501
Official URL:http://dx.doi.org/10.1016/0304-8853(93)91353-9
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