VLSI Reliability in Europe


Verweij, Jan F. (1993) VLSI Reliability in Europe. Proceedings of the IEEE, 81 (5). pp. 675-681. ISSN 0018-9219

open access
Abstract:Several issue's regarding VLSI reliability research in Europe are discussed. Organizations involved in stimulating the activities on reliability by exchanging information or supporting research programs are described. Within one such program, ESPRIT, a technical interest group on IC reliability was formed to formulate particular needs and necessary improvements in education and research. In addition to ESPRIT research projects, there are smaller projects on reliability subjects. Two examples, one dealing with plastic-encapsulation and the other with electrostatic discharge, are treated in some detail. Some achievements in the areas of oxide breakdown and plastic encapsulated ICs in temperature cycling are also presented. A few opinions are offered on trends in reliability engineering, including reliability circuit simulation
Item Type:Article
Copyright:©1993 IEEE
Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:
Link to this item:http://purl.utwente.nl/publications/15162
Official URL:https://doi.org/10.1109/5.220899
Export this item as:BibTeX
HTML Citation
Reference Manager


Repository Staff Only: item control page

Metis ID: 112036