Testability analysis of analog systems

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Hemink, Gertjan J. and Meijer, Berend W. and Kerkhoff, Hans G. (1990) Testability analysis of analog systems. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 9 (6). pp. 573-583. ISSN 0278-0070

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Abstract:A method is presented to analyze the testability of both linear and nonlinear analog systems. It combines a rank-test algorithm with statistical methods. The algorithm will find sets of dependent parameters and determine whether it is possible to calculate a certain parameter with sufficient accuracy. it also determines a subset of appropriate measurements if redundant measurements are present
Item Type:Article
Copyright:© 1990 IEEE
Faculty:
Electrical Engineering, Mathematics and Computer Science (EEMCS)
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Link to this item:http://purl.utwente.nl/publications/15150
Official URL:http://dx.doi.org/10.1109/43.55186
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