Dielectric breakdown II: Related projects at the University of Twente

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Klootwijk, J.H. and Verweij, J.F. and Rem, J.B. and Bijlsma, S. (1996) Dielectric breakdown II: Related projects at the University of Twente. Microelectronics Journal, 27 (7). pp. 623-632. ISSN 0026-2692

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Abstract:In this paper an overview is given of the related activities in our group of the University of Twente. These are on thin film transistors with the inherent difficulty of making a gate dielectric at low temperature, on thin dielectrics for EEPROM devices with well-known requirements with respect to charge retention and endurance and, finally, on thin film diodes in displays with unexpected breakdown properties.
Item Type:Article
Copyright:© 1996 Elsevier Science
Faculty:
Electrical Engineering, Mathematics and Computer Science (EEMCS)
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Link to this item:http://purl.utwente.nl/publications/15125
Official URL:http://dx.doi.org/10.1016/0026-2692(95)00105-0
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Metis ID: 111997