Comparison of recording properties of ME tape and thin MP tape with respect to overwrite behavior

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Lalbahadoersing, S. and Groenland, J.P.J. and Luitjens, S.B. and Lodder, J.C. (1997) Comparison of recording properties of ME tape and thin MP tape with respect to overwrite behavior. IEEE Transactions on Magnetics, 33 (5). pp. 3061-3063. ISSN 0018-9464

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Abstract:Differences between the recording characteristics of thin MP and ME tape are studied. The effect of the thickness reduction of MP tape is also investigated. When thin MP tape (with thickness 140 nm) is compared with ME tape (with thickness 150 nm), we observe a better signal and overwrite response for the ME tape. Through simulations the influence of an easy axis out-of-plane and a different reversal mechanism in ME tape is related to overwrite behavior
Item Type:Article
Copyright:©1997 IEEE
Faculty:
Electrical Engineering, Mathematics and Computer Science (EEMCS)
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Link to this item:http://purl.utwente.nl/publications/14948
Official URL:http://dx.doi.org/10.1109/20.617844
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