Normalized Analysis for the Sensitivity Optimization of Integrated Optical Evanescent-Wave Sensors

Parriaux, Olivier and Veldhuis, G.J. (1998) Normalized Analysis for the Sensitivity Optimization of Integrated Optical Evanescent-Wave Sensors. Journal of Lightwave Technology, 16 (4). pp. 573-582. ISSN 0733-8724

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Abstract:	Closed-form analytical expressions and normalized charts provide the conditions for the maximum sensitivity of transverse electric (TE) and transverse magnetic (TM) evanescent-wave step-index waveguide sensors. The analysis covers both cases where the measurand is homogeneously distributed in the semi-infinite waveguide cover, and where it is an ultrathin film at the waveguide-cover interface
Item Type:	Article
Copyright:	©1998 IEEE
Faculty:	Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:	Integrated Optical MicroSystems (IOMS)
Link to this item:	http://purl.utwente.nl/publications/14302
Official URL:	http://dx.doi.org/10.1109/50.664066
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